Obsidian Sensors is pleased to announce its new higher resolution thermal imaging sensor: SVGA (800x600) on a 17um pixel ...

Increasing complexity of semiconductor devices necessitates a fundamental rethinking of defect detection methodologies.

Detecting macro-defects on wafers and tracing them to their root cause is getting easier due to tool improvements and traceability advancements.

Introduction Semiconductor manufacturing is an intricate process that demands exceptional precision and accuracy. Robotics plays a pivotal role in ensuring seamless operations, performing essential ...