Controlling film thickness to precise specifications is essential for ensuring high yield in high-performance devices.

The interferometry technique described here has been extended to measure the thickness of transparent and semitransparent films. Thick and thin films present some potential problems during optical ...

This project delves into the principles of interference, particularly focusing on how light waves interact with very thin films ... [Stoppi] used an interferometer made from semi-transparent ...

Thin film thickness measurement option measures film thickness using ZFT reflectometry principles. ZSI shearing interferometer provides Angstrom-level vertical resolution. PSI phase shifting ...

Produces extremely low-loss, Ion Beam Sputtered (IBS), laser damage resistant thin films for the UV-VIS-IR spectral region ... laser photometry, visible and IR interferometry. Product applications ...