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TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (www.jeol.com) (President Gon-emon Kurihara) announces the release of a new benchtop scanning electron microscope (SEM), the JCM-7000 series NeoScope TM, ...
Electron microscopes give us insight into the tiniest details of materials and can visualize, for example, the structure of solids, molecules or nanoparticles with atomic resolution. However, most ...
When Gang Ren whirls the controls of his cryo-electron microscope, he compares it to fine-tuning the gearshift and brakes of a racing bicycle. But this machine at the U.S. Department of Energy (DOE)'s ...
A £3 million electron microscope has arrived at the University of Oxford's Department of Materials. The microscope will support research across the university's departments and divisions. It was ...
Unlike the electron beam used in scanning and transmission electron microscopy (SEM, TEM), the beam in a focused ion beam system (FIB) is composed of gallium (Ga) ions. The ions forming the structure ...
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